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产品型号BUZ40B的Datasheet PDF文件预览

BUZ 40 B  
®
SIPMOS Power Transistor  
• N channel  
• Enhancement mode  
• Avalanche-rated  
Pin 1  
Pin 2  
Pin 3  
G
D
S
Type  
V
DS  
I
R
)
DS(on  
Package  
Ordering Code  
D
BUZ 40 B  
500 V  
8.5 A  
0.8 Ω  
TO-220 AB  
C67078-S1305-A4  
Maximum Ratings  
Parameter  
Symbol  
Values  
Unit  
Continuous drain current  
I
I
I
A
D
T = 35 °C  
C
8.5  
Pulsed drain current  
Dpuls  
AR  
T = 25 °C  
C
34  
10  
13  
Avalanche current,limited by T  
jmax  
Avalanche energy,periodic limited by T  
Avalanche energy, single pulse  
E
mJ  
jmax  
AR  
AS  
E
I = 10 A, V = 50 V, R = 25 Ω  
D
DD  
GS  
L = 10.3 mH, T = 25 °C  
570  
j
±
Gate source voltage  
Power dissipation  
V
P
20  
V
GS  
W
tot  
T = 25 °C  
C
150  
Operating temperature  
Storage temperature  
T
T
-55 ... + 150 °C  
-55 ... + 150  
j
stg  
Thermal resistance, chip case  
R
0.83  
K/W  
thJC  
thJA  
Thermal resistance, chip to ambient  
DIN humidity category, DIN 40 040  
IEC climatic category, DIN IEC 68-1  
R
75  
E
55 / 150 / 56  
Semiconductor Group  
1
07/96  
BUZ 40 B  
Electrical Characteristics, at T = 25°C, unless otherwise specified  
j
Parameter  
Symbol  
Values  
typ.  
Unit  
min.  
max.  
Static Characteristics  
Drain- source breakdown voltage  
V
V
V
(BR)DSS  
GS(th)  
DSS  
V
GS  
= 0 V, I = 0.25 mA, T = 25 °C  
500  
2.1  
-
-
D
j
Gate threshold voltage  
=
V
V
I = 1 mA  
3
4
GS DS, D  
Zero gate voltage drain current  
I
I
µA  
V
DS  
V
DS  
= 500 V, V = 0 V, T = 25 °C  
-
-
0.1  
10  
1
GS  
j
= 500 V, V = 0 V, T = 125 °C  
100  
GS  
j
Gate-source leakage current  
= 20 V, V = 0 V  
nA  
GSS  
V
GS  
-
-
10  
100  
0.8  
DS  
Drain-Source on-resistance  
= 10 V, I = 5.5 A  
R
DS(on)  
V
GS  
0.6  
D
Semiconductor Group  
2
07/96  
BUZ 40 B  
Electrical Characteristics, at T = 25°C, unless otherwise specified  
j
Parameter  
Symbol  
Values  
typ.  
Unit  
min.  
max.  
Dynamic Characteristics  
Transconductance  
g
S
fs  
V
2 I  
R I = 5.5 A  
5
-
8
-
DS  
* D * DS(on)max, D  
Input capacitance  
= 0 V, V = 25 V, f = 1 MHz  
C
C
C
pF  
iss  
oss  
V
1500  
180  
65  
2300  
270  
100  
GS  
DS  
Output capacitance  
= 0 V, V = 25 V, f = 1 MHz  
V
-
GS  
DS  
Reverse transfer capacitance  
= 0 V, V = 25 V, f = 1 MHz  
rss  
V
-
GS  
DS  
Turn-on delay time  
= 30 V, V = 10 V, I = 3 A  
t
t
t
t
ns  
d(on)  
V
DD  
GS  
D
R
GS  
= 50  
-
-
-
-
20  
30  
Rise time  
= 30 V, V = 10 V, I = 3 A  
r
V
DD  
GS  
D
R
GS  
= 50  
70  
110  
340  
100  
Turn-off delay time  
= 30 V, V = 10 V, I = 3 A  
d(off)  
V
DD  
GS  
D
R
GS  
= 50  
260  
80  
Fall time  
= 30 V, V = 10 V, I = 3 A  
f
V
DD  
GS  
D
= 50  
R
GS  
Semiconductor Group  
3
07/96  
BUZ 40 B  
Electrical Characteristics, at T = 25°C, unless otherwise specified  
j
Parameter  
Symbol  
Values  
typ.  
Unit  
min.  
max.  
Reverse Diode  
Inverse diode continuous forward current I  
A
S
T = 25 °C  
-
-
-
-
-
-
8.5  
34  
1.3  
-
C
Inverse diode direct current,pulsed  
I
SM  
T = 25 °C  
C
-
Inverse diode forward voltage  
V
SD  
V
V
GS  
= 0 V, I = 20 A  
1.1  
380  
4
F
Reverse recovery time  
V = 100 V, I =l di /dt = 100 A/µs  
t
ns  
µC  
rr  
R
F S,  
F
Reverse recovery charge  
Q
rr  
=
V = 100 V, I l di /dt = 100 A/µs  
R
-
F S,  
F
Semiconductor Group  
4
07/96  
BUZ 40 B  
Drain current  
Power dissipation  
ƒ
I = (T )  
ƒ
P
= (T )  
D
C
tot  
C
parameter: V  
10 V  
GS  
9
160  
W
A
ID  
Ptot  
7
120  
100  
80  
6
5
4
3
2
60  
40  
20  
1
0
0
0
0
20  
40  
60  
80 100 120  
°C 160  
TC  
20  
40  
60  
80 100 120  
°C 160  
TC  
Safe operating area  
Transient thermal impedance  
ƒ
ƒ
I = (V  
)
Z
= (t )  
th JC  
D
DS  
p
parameter: D = 0.01, T = 25°C  
parameter: D = t / T  
C
p
10 2  
10 0  
t
= 6.4µs  
10 µs  
p
A
K/W  
ID  
ZthJC  
100 µs  
10 1  
10 -1  
I
1 ms  
V
10 ms  
D = 0.50  
R
0.20  
0.10  
0.05  
0.02  
0.01  
10 0  
10 -2  
single pulse  
DC  
10 -1  
10 -3  
10 0  
10 1  
10 2  
V 10 3  
VDS  
10 -7 10 -6 10 -5 10 -4 10 -3 10 -2 10 -1s 10 0  
tp  
5
07/96  
Semiconductor Group  
BUZ 40 B  
Typ. output characteristics  
ƒ(  
Typ. drain-source on-resistance  
ƒ(  
I =  
V
)
R
=
I )  
D
D
DS  
DS (on)  
parameter: t = 80 µs  
parameter: V  
p
GS  
2.6  
19  
P
tot = 150W  
j
l
k
h g  
i
f
A
a
b
c
d
2.2  
V
[V]  
e
16  
GS  
a
4.0  
4.5  
5.0  
5.5  
6.0  
6.5  
7.0  
7.5  
8.0  
9.0  
ID  
RDS (on)  
2.0  
b
c
d
e
f
14  
12  
10  
8
1.8  
1.6  
1.4  
1.2  
1.0  
0.8  
0.6  
0.4  
d
g
h
i
c
e
f
j
6
g
k
l
10.0  
20.0  
h
i
j
k
4
b
V
[V] =  
b
GS  
a
2
0
c
d
e
f
g
h
i
j
k
0.2  
0.0  
a
4.5 5.0 5.5 6.0 6.5 7.0  
7.5 8.0 9.0 10.0 20.0  
0
4
8
12  
16  
20  
24  
28  
V
34  
0
2
4
6
8
10 12 14  
A
18  
VDS  
ID  
Typ. transfer characteristics I = f (V  
)
Typ. forward transconductance g = f (I )  
D
fs  
D
GS  
parameter: t = 80 µs  
parameter: t = 80 µs,  
p
p
V
DS  
2 x I x R  
V
DS  
2 x I x R  
D
DS(on)max  
D
DS(on)max  
10  
A
8
12  
S
10  
9
ID  
gfs  
7
8
6
7
5
6
5
4
4
3
3
2
2
1
0
1
0
0
1
2
3
4
5
6
7
8
V
10  
0
1
2
3
4
5
6
7
A
9
VGS  
ID  
Semiconductor Group  
6
07/96  
BUZ 40 B  
Gate threshold voltage  
Drain-source on-resistance  
ƒ
= (T )  
j
V
ƒ
= (T )  
j
R
GS (th)  
DS (on)  
parameter: V = V , I = 1 mA  
parameter: I = 5.5 A, V = 10 V  
GS  
DS  
D
D
GS  
3.4  
4.6  
V
98%  
4.0  
2.8  
2.4  
2.0  
1.6  
1.2  
0.8  
VGS(th)  
RDS (on)  
3.6  
3.2  
2.8  
2.4  
2.0  
1.6  
1.2  
0.8  
typ  
2%  
98%  
typ  
0.4  
0.0  
0.4  
0.0  
-60  
-20  
20  
60  
100  
°C  
Tj  
160  
-60  
-20  
20  
60  
100  
°C  
Tj  
160  
Typ. capacitances  
Forward characteristics of reverse diode  
C = f (V )  
ƒ
I = (V  
)
DS  
F
SD  
parameter:V = 0V, f = 1MHz  
parameter: T , t = 80 µs  
GS  
j
p
10 1  
10 2  
nF  
A
IF  
C
Ciss  
10 0  
10 -1  
10 -2  
10 1  
10 0  
10 -1  
Coss  
Tj = 25 °C typ  
Crss  
Tj = 150 °C typ  
Tj = 25 °C (98%)  
Tj = 150 °C (98%)  
0
5
10  
15  
20  
25  
30  
V
40  
0.0  
0.4  
0.8  
1.2  
1.6  
2.0  
2.4  
V
3.0  
VDS  
VSD  
7
07/96  
Semiconductor Group  
BUZ 40 B  
ƒ
Avalanche energy E = (T )  
Typ. gate charge  
AS  
j
ƒ
parameter: I = 10 A, V = 50 V  
V
= (Q  
)
D
DD  
GS  
Gate  
R
= 25 , L = 10.3 mH  
parameter: I  
= 12 A  
D puls  
GS  
600  
mJ  
16  
V
500  
450  
400  
350  
300  
250  
200  
150  
100  
EAS  
VGS  
12  
10  
8
V
V
DS max  
0,2  
0,8  
DS max  
6
4
2
50  
0
0
0
20  
40  
60  
80  
100  
120  
°C  
Tj  
160  
20  
40  
60  
80  
nC  
110  
QGate  
Drain-source breakdown voltage  
ƒ
= (T )  
j
V
(BR)DSS  
600  
V
580  
V(BR)DSS570  
560  
550  
540  
530  
520  
510  
500  
490  
480  
470  
460  
450  
-60  
-20  
20  
60  
100  
°C  
Tj  
160  
Semiconductor Group  
8
07/96  
BUZ 40 B  
Package Outlines  
TO-220 AB  
Dimension in mm  
Semiconductor Group  
9
07/96  
配单直通车
BUZ40B产品参数
型号:BUZ40B
生命周期:Transferred
IHS 制造商:SIEMENS A G
零件包装代码:SFM
包装说明:FLANGE MOUNT, R-PSFM-T3
针数:3
Reach Compliance Code:unknown
风险等级:5.1
Is Samacsys:N
雪崩能效等级(Eas):570 mJ
配置:SINGLE
最小漏源击穿电压:500 V
最大漏极电流 (ID):8 A
最大漏源导通电阻:0.8 Ω
FET 技术:METAL-OXIDE SEMICONDUCTOR
最大反馈电容 (Crss):100 pF
JEDEC-95代码:TO-220AB
JESD-30 代码:R-PSFM-T3
元件数量:1
端子数量:3
工作模式:ENHANCEMENT MODE
最高工作温度:150 °C
封装主体材料:PLASTIC/EPOXY
封装形状:RECTANGULAR
封装形式:FLANGE MOUNT
极性/信道类型:N-CHANNEL
功耗环境最大值:150 W
最大脉冲漏极电流 (IDM):34 A
认证状态:Not Qualified
表面贴装:NO
端子形式:THROUGH-HOLE
端子位置:SINGLE
晶体管应用:SWITCHING
晶体管元件材料:SILICON
最大关闭时间(toff):440 ns
最大开启时间(吨):140 ns
Base Number Matches:1
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