Experimental observation of the improvement in MTF from backthinning a CMOS direct electron detector (Q42428583)
Jump to navigation
Jump to search
scientific article published on 18 May 2009
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Experimental observation of the improvement in MTF from backthinning a CMOS direct electron detector |
scientific article published on 18 May 2009 |
Statements
1 reference
Experimental observation of the improvement in MTF from backthinning a CMOS direct electron detector (English)
1 reference
G McMullan
1 reference
A R Faruqi
1 reference
R Henderson
1 reference
N Guerrini
1 reference
R Turchetta
1 reference
A Jacobs
1 reference
G van Hoften
1 reference
18 May 2009
1 reference
1 reference
109
1 reference
1144-1147
1 reference
Identifiers
1 reference
1 reference
1 reference