Measurement of the 4Pi‐confocal point spread function proves 75 nm axial resolution (Q64225882)

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Language	Label	Description	Also known as
English	Measurement of the 4Pi‐confocal point spread function proves 75 nm axial resolution	No description defined

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instance of

scholarly article

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title

Measurement of the 4Pi‐confocal point spread function proves 75 nm axial resolution (English)

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author

Stefan Hell

series ordinal

1

object named as

S. W. Hell

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author name string

S. Lindek

series ordinal

2

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C. Cremer

series ordinal

3

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E. H. K. Stelzer

series ordinal

4

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publication date

14 March 1994

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published in

Applied Physics Letters

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volume

64

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issue

11

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page(s)

1335-1337

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cites work

Properties of a 4Pi confocal fluorescence microscope

1 reference

stated in

Crossref

reference URL

https://api.crossref.org/works/10.1063%2F1.111926

retrieved

21 January 2018

Identifiers

DOI

10.1063/1.111926

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